Secondary Ion Mass Spectrometers 

We are engaged in manufacturing a wide range of Secondary Ion Mass Spectrometers which are fabricated in accordance with the specifications of our clients. These are known to offer optimum performance and are used in various labs as well as research institutions.

Specifications and features:

HAL EQS SIMS Systems
High Sensitivity-White triple stage mass filter and high transmission sector field energy filter
Raster Control-For enhanced depth profiling capability.
Positive and Negative Ion Counting-Up to 2 X 107 cps.
SIMS Software Tuning-For optimum parameter adjustment via a dynamic display
Ideal for static and dynamic SIMS applications
Ionised species with masses up to 500 amu analyzed
An integral electron impact ion source utilized for conventional RGA, leak detection and Secondary Neutral Mass Spectrometry (SNMS)
Employs a high performance triple quadrupole filter and a 45° sector field analyser with DC quadrupole input focusing lens
Ions passing through the instrument have simple curved trajectories with virtually 100% transmission within the pass band
Full high resolution ion energy analysis capability. Ion counts from 1 to 2 X 107 cps are made from an off axis,low background, high sensitivity detector
Operating modes and example spectra
Positive and Negative SIMS spectra
Detection of both positive and negative secondary ions is essential since both spectra contain important chemical information
Positive and negative histogram spectra from an amorphous metallic alloy of the composition CO(79%) B(7%) taken with a primary ion current of 1 nA.