CF Offline Microscope for RGB PR thickness and Color measurement
R&D Hi-Tech cooperate with Germany Optection company. develop system for many different industry such as TFT. Solar Cell, Optical disc.
The core competencies consist of the following:
AOI (Defect, Print and Surface Inspection)
Spectral Reflectivity/Transmission Measurement,
Film/Layer- Thickness Measurements,
Optical density measurements,
Components & Modules development for Optical Measuring
(consisting of optical- electrical, mechanical & software Modules)
(consisting of optical- electrical, mechanical & software Modules)
Product design for inline applications and process control
Integration of inspection systems whith standard cycle times < 1.5s
worldwide installations, worldwide service and after sales support.
R&D Hi-Tech cooperate with Germany Optection company. develop system for many different industry such as TFT. Solar Cell, Optical disc.
The core competencies consist of the following:
AOI (Defect, Print and Surface Inspection)
Spectral Reflectivity/Transmission Measurement,
Film/Layer- Thickness Measurements,
Optical density measurements,
Components & Modules development for Optical Measuring
(consisting of optical- electrical, mechanical & software Modules)
(consisting of optical- electrical, mechanical & software Modules)
Product design for inline applications and process control
Integration of inspection systems whith standard cycle times < 1.5s
worldwide installations, worldwide service and after sales support.